• Method And Apparatus For Analyzing An Image To Detect And Identify Patterns 

      Vachtesvanos, George J.; Dorrity, Lewis J.; Wang, Peng; Echauz, Javier; Mufti, Muid (11/18/2003)
      A method and apparatus is provided which analyzes an image of an object to detect and identify defects in the object utilizing multi-dimensional wavelet neural networks. "The present invention generates a signal representing ...