Browsing School of Electrical and Computer Engineering OSP Research Reports by Author "Chatterjee, Abhijit"
Now showing items 1-4 of 4
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Adaptive FPGA-based Test Module
Chatterjee, Abhijit; Keezer, David C. (Georgia Institute of Technology, 2013-05-30)The objective of the project is to develop methods and electronics for testing multi-GHz digital components (such as DDR memories), using low-cost methods based on state-of-the-art field programmable gate arrays (FPGAs). ... -
Optimal linearity testing of sigma-delta based incremental ADCs using restricted code measurements
Chatterjee, Abhijit; Kook, S.; Gomes, A.; Jin, L.; Wheelright, D. (Georgia Institute of Technology, 2010-11)Linearity testing of high-precision (beyond 20-bit resolution) Analog-to-Digital converters (ADCs) is extremely expensive due to the large number of codes (>16 million for a 24-bit converter) that need to be tested and the ... -
Signal acquisition of high-speed periodic signals using incoherent sub-sampling and back-end signal reconstruction algorithms
Chatterjee, Abhijit; Gomes, Alfred V.; Choi, Hyun (Georgia Institute of Technology, 2009-02)This paper presents a high-speed periodic signal acquisition technique using incoherent sub-sampling and backend signal reconstruction algorithms. The signal reconstruction algorithms employ a frequency domain analysis for ... -
Targeting multi-core clock performance gains: vertically integrated adaptation and prototyping
Chatterjee, Abhijit (Georgia Institute of Technology, 2012-06)A low cost post-manufacturing testing and speed tuning methodology is proposed in a multi-processor system. The goal of this research is to develop a methodology that allows the “safe” speed of each core in a large CMP to ...