Toggle navigation
Login
Toggle navigation
View Item
SMARTech Home
Georgia Tech Theses and Dissertations
Georgia Tech Theses and Dissertations
View Item
SMARTech Home
Georgia Tech Theses and Dissertations
Georgia Tech Theses and Dissertations
View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
A comparison atlas of electron and scanning electron fractrography.
View/
Open
hubbard_james_l_197108_ms_261150.pdf (11.39Mb)
Date
1971-08
Author
Hubbard, James Lee
Metadata
Show full item record
URI
http://hdl.handle.net/1853/10963
Collections
Georgia Tech Theses and Dissertations
[23403]
School of Materials Science and Engineering Theses and Dissertations
[960]
Search SMARTech
This Collection
Browse
All of SMARTech
Communities & Collections
Dates
Authors
Titles
Subjects
Types
This Collection
Dates
Authors
Titles
Subjects
Types
My SMARTech
Login
Statistics
View Usage Statistics
View Google Analytics Statistics