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dc.contributor.authorZhou, Qingen_US
dc.date.accessioned2006-12-21T15:09:30Z
dc.date.available2006-12-21T15:09:30Z
dc.date.issued2001-08en_US
dc.identifier.urihttp://hdl.handle.net/1853/13010
dc.format.extent234 bytes
dc.format.mimetypetext/html
dc.language.isoen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshIntegrated circuits Testingen_US
dc.titleTest support processor for enhanced testability of high performance integrated circuitsen_US
dc.typeDissertationen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentElectrical and Computer Engineeringen_US
dc.contributor.departmentElectrical Engineeringen_US
dc.description.advisorDavid C. Keezer
dc.identifier.bibid610910en_US


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