| dc.contributor.advisor | Keezer, David C. | |
| dc.contributor.author | Zhou, Qing | en_US |
| dc.date.accessioned | 2006-12-21T15:09:30Z | |
| dc.date.available | 2006-12-21T15:09:30Z | |
| dc.date.issued | 2001-08 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1853/13010 | |
| dc.format.extent | 234 bytes | |
| dc.format.mimetype | text/html | |
| dc.language.iso | en_US | |
| dc.publisher | Georgia Institute of Technology | en_US |
| dc.rights | Access restricted to authorized Georgia Tech users only. | en_US |
| dc.subject.lcsh | Integrated circuits Testing | en_US |
| dc.title | Test support processor for enhanced testability of high performance integrated circuits | en_US |
| dc.type | Text | |
| dc.description.degree | Ph.D. | en_US |
| dc.contributor.department | Electrical and Computer Engineering | en_US |
| dc.contributor.department | Electrical Engineering | en_US |
| dc.identifier.bibid | 610910 | en_US |
| dc.type.genre | Dissertation | |
