| dc.contributor.author | Yoon, Heebyung | en_US |
| dc.date.accessioned | 2006-12-21T15:10:11Z | |
| dc.date.available | 2006-12-21T15:10:11Z | |
| dc.date.issued | 1998-08 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1853/13041 | |
| dc.format.extent | 238 bytes | |
| dc.format.mimetype | text/html | |
| dc.language.iso | en_US | |
| dc.publisher | Georgia Institute of Technology | en_US |
| dc.rights | Access restricted to authorized Georgia Tech users only. | en_US |
| dc.subject.lcsh | Analog electronic systems | en_US |
| dc.subject.lcsh | Electric circuit analysis | en_US |
| dc.title | Fault detection and identification techniques for embedded analog circuits | en_US |
| dc.type | Dissertation | en_US |
| dc.description.degree | Ph.D. | en_US |
| dc.contributor.department | Electrical and Computer Engineering | en_US |
| dc.description.advisor | Abhijit Chatterjee | |
| dc.identifier.bibid | 475383 | en_US |
