Study of thru-reflect-line calibration : applications to microwave/millimeter wave characterization

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1853/13520

Title: Study of thru-reflect-line calibration : applications to microwave/millimeter wave characterization
Author: Pham, Anh-Vu Huynh
Type: Thesis
URI: http://hdl.handle.net/1853/13520
Date: 1997-12
Publisher: Georgia Institute of Technology
Subject: Microwave devices
Millimeter wave devices
Calibration
Department: Electrical and Computer Engineering
Electric Engineering
Advisor: J. Laskar
Degree: M.S.

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