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dc.contributor.authorPant, Pankajen_US
dc.date.accessioned2007-03-01T18:52:16Z
dc.date.available2007-03-01T18:52:16Z
dc.date.issued2000-08en_US
dc.identifier.urihttp://hdl.handle.net/1853/13556
dc.format.extent236 bytes
dc.format.mimetypetext/html
dc.language.isoen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshElectronic circuits Testingen_US
dc.subject.lcshElectronic circuits Design and constructionen_US
dc.titleAutomated diagnosis of path delay faults in digital integrated circuitsen_US
dc.typeDissertation
dc.description.degreePh.D.
dc.contributor.departmentElectrical and Computer Engineeringen_US
dc.description.advisorAbhijit Chatterjeeen_US
dc.identifier.bibid562776en_US


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