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dc.contributor.authorKim, Intaeken_US
dc.date.accessioned2007-03-27T13:26:23Z
dc.date.available2007-03-27T13:26:23Z
dc.date.issued1992-12en_US
dc.identifier.urihttp://hdl.handle.net/1853/13743
dc.format.extent235 bytes
dc.format.mimetypetext/html
dc.language.isoen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshOptical pattern recognitionen_US
dc.subject.lcshOptical detectorsen_US
dc.titleA Hybrid analytical/intelligent methodology for sensor fusionen_US
dc.typeDissertationen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentElectric engineeringen_US
dc.description.advisorGeorge Vachtsevanosen_US
dc.identifier.bibid364318en_US


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