A parallel digital interconnect test methodology for multi-chip module substrate networks

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1853/13847

Title: A parallel digital interconnect test methodology for multi-chip module substrate networks
Author: Newman, Kimberly Eileen
Type: Dissertation
URI: http://hdl.handle.net/1853/13847
Date: 1999-05
Publisher: Georgia Institute of Technology
Subject: Multichip modules (Microelectronics) Testing
Parallel processing (Electronic computers)
Department: Electrical and Computer Engineering
Electric Engineering
Advisor: David Keezer
Degree: Ph.D.

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