Parallel test techniques for multi-chip modules

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1853/13863

Title: Parallel test techniques for multi-chip modules
Author: Sasidhar, Koppolu
Type: Dissertation
URI: http://hdl.handle.net/1853/13863
Date: 1997-08
Publisher: Georgia Institute of Technology
Subject: Multichip modules (Microelectronics) Design and construction
Multichip modules (Microelectronics) Testing
Department: Electrical and computer engineering
Electric engineering
Advisor: Abhijit Chatterjee
Degree: Ph.D.

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