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dc.contributor.authorKim, Dong-Wooken_US
dc.date.accessioned2007-03-27T13:29:18Z
dc.date.available2007-03-27T13:29:18Z
dc.date.issued1991-08en_US
dc.identifier.urihttp://hdl.handle.net/1853/13890
dc.format.extent238 bytes
dc.format.mimetypetext/html
dc.language.isoen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshMetal oxide semiconductorsen_US
dc.subject.lcshDigital electronicsen_US
dc.subject.lcshComplementary
dc.titleCMOS digital circuit test generation for transistor level and gate-level implementationen_US
dc.typeDissertationen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentElectrical Engineeringen_US
dc.description.advisorJay H. Schlagen_US
dc.identifier.bibid348015en_US


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