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dc.contributor.authorCherubal, Sasikumaren_US
dc.date.accessioned2007-07-06T11:30:39Z
dc.date.available2007-07-06T11:30:39Z
dc.date.issued2002-05en_US
dc.identifier.urihttp://hdl.handle.net/1853/15450
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshMixed signal circuits Testingen_US
dc.subject.lcshElectric fault locationen_US
dc.titleFault isolation and diagnosis techniques for mixed-signal circuitsen_US
dc.typeDissertationen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentElectrical and computer engineeringen_US
dc.description.advisorAbhijit Chatterjeeen_US
dc.identifier.bibid629153en_US


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