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dc.contributor.authorCarastro, Lawrence A.en_US
dc.date.accessioned2007-07-06T11:31:57Z
dc.date.available2007-07-06T11:31:57Z
dc.date.issued2002-05en_US
dc.identifier.urihttp://hdl.handle.net/1853/15482
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshElectronic packagingen_US
dc.subject.lcshIntegrated circuits Passivationen_US
dc.subject.lcshAnalog-to-digital convertersen_US
dc.titlePredictive statistical analysis of embedded meander resistors via measurement of canonical building blocksen_US
dc.typeDissertationen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentElectrical and computer engineeringen_US
dc.contributor.departmentElectrical engineeringen_US
dc.description.advisorMartin A. Brookeen_US
dc.identifier.bibid629136en_US


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