Compound semiconductor compliant substrates for extension of the conventional critical thickness in mismatched overlayers and strain-modulated epitaxy

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Date

1996-12

Author

Coman, Carrie Anne Carter

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URI

http://hdl.handle.net/1853/15512

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• Georgia Tech Theses and Dissertations [19949]
• School of Electrical and Computer Engineering Theses and Dissertations [2704]