Compound semiconductor compliant substrates for extension of the conventional critical thickness in mismatched overlayers and strain-modulated epitaxy

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coman_carrie_a_199612_phd_444178.pdf (20.03Mb)

Date

1996-12

Author

Coman, Carrie Anne Carter

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URI

http://hdl.handle.net/1853/15512

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• Georgia Tech Theses and Dissertations [23403]
• School of Electrical and Computer Engineering Theses and Dissertations [3303]