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    Fundamental understanding, characterization, passivation and gettering of electrically active defects in silicon

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    doolittle_william_a_199605_phd_423412.pdf (30.93Mb)
    Date
    1996-05
    Author
    Doolittle, William Alan
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    URI
    http://hdl.handle.net/1853/15710
    Collections
    • Georgia Tech Theses and Dissertations [23403]
    • School of Electrical and Computer Engineering Theses and Dissertations [3303]

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