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dc.contributor.authorHeng, Stephen Fook-Geowen_US
dc.date.accessioned2007-09-26T14:42:56Z
dc.date.available2007-09-26T14:42:56Z
dc.date.issued1988-08en_US
dc.identifier.urihttp://hdl.handle.net/1853/16694
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshMicroelectronicsen_US
dc.subject.lcshHeat Transmissionen_US
dc.titleExperimental and theoretical thermal analysis of microelectronic devicesen_US
dc.typeDissertationen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMechanical engineeringen_US
dc.description.advisorWilliam Z. Blacken_US
dc.identifier.bibid319794en_US


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