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dc.contributor.authorZheng, Tieyuen_US
dc.date.accessioned2007-11-15T12:42:18Z
dc.date.available2007-11-15T12:42:18Z
dc.date.issued2000-08en_US
dc.identifier.urihttp://hdl.handle.net/1853/17516
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshStrains and stresses Measurementen_US
dc.subject.lcshStructural engineeringen_US
dc.subject.lcshMatteren_US
dc.subject.lcshTestingen_US
dc.titleA study of residual stresses in thin anisotropic (silicon) platesen_US
dc.typeDissertationen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMechanical engineeringen_US
dc.description.advisorSteven Danyluken_US
dc.identifier.bibid562918en_US


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