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dc.contributor.authorTing, Bond-Yenen_US
dc.date.accessioned2007-11-15T12:48:36Z
dc.date.available2007-11-15T12:48:36Z
dc.date.issued1983-08en_US
dc.identifier.urihttp://hdl.handle.net/1853/17643
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshThin filmsen_US
dc.subject.lcshAdhesionen_US
dc.titleA semi-quantitative method for thin film adhesion measurementen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMechanical engineeringen_US
dc.description.advisorSubbiah Ramalingamen_US
dc.identifier.bibid266648en_US


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