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dc.contributor.authorDavis, Brian Edwarden_US
dc.date.accessioned2007-11-15T12:49:56Z
dc.date.available2007-11-15T12:49:56Z
dc.date.issued2001-12en_US
dc.identifier.urihttp://hdl.handle.net/1853/17677
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshDesign, Industrial Data processingen_US
dc.subject.lcshIon beam lithographyen_US
dc.subject.lcshRapid prototypingen_US
dc.subject.lcshPrototypes, Engineeringen_US
dc.titleCharacterization and calibration of stereolithography products and processesen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMechanical engineeringen_US
dc.description.advisorWilliam Z. Blacken_US
dc.identifier.bibid629460en_US


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