Show simple item record

dc.contributor.authorCampbell, James Stephen, Jr.en_US
dc.date.accessioned2008-01-24T12:31:03Z
dc.date.available2008-01-24T12:31:03Z
dc.date.issued1997-05en_US
dc.identifier.urihttp://hdl.handle.net/1853/19244
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshMicroelectronic packaging Testingen_US
dc.subject.lcshMicroelectronicsen_US
dc.subject.lcshThermal stressesen_US
dc.titleEstablishment of an analytical and experimental test facility for the evaluation of thermal management in microelectric packagesen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMechanical engineeringen_US
dc.description.advisorWilliam Z. Blacken_US
dc.identifier.bibid449458en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record