| dc.contributor.advisor | Saxena, Ashok | |
| dc.contributor.author | Muhlstein, Christopher L. | en_US |
| dc.date.accessioned | 2008-01-31T12:34:56Z | |
| dc.date.available | 2008-01-31T12:34:56Z | |
| dc.date.issued | 1996-05 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1853/19466 | |
| dc.publisher | Georgia Institute of Technology | en_US |
| dc.rights | Access restricted to authorized Georgia Tech users only. | en_US |
| dc.subject.lcsh | Image processing Digital techniques | en_US |
| dc.subject.lcsh | Silicon | en_US |
| dc.subject.lcsh | Silicon Stress corrosion | en_US |
| dc.title | The effect of temperature and microstructure on the fatigue crack growth behavior of AL-Cu alloy C415 | en_US |
| dc.type | Text | |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Materials science and engineering | en_US |
| dc.identifier.bibid | 423550 | en_US |
| dc.type.genre | Thesis | |
