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dc.contributor.authorPiotrowski, David P.en_US
dc.date.accessioned2008-02-21T12:32:09Z
dc.date.available2008-02-21T12:32:09Z
dc.date.issued1996-05en_US
dc.identifier.urihttp://hdl.handle.net/1853/19985
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshCrystalsen_US
dc.subject.lcshX-rays Diffractionen_US
dc.subject.lcshTomographyen_US
dc.subject.lcshMaterials Fatigueen_US
dc.titleSynchrotron polychromatic x-ray diffraction tomography of large-grained polycrystalline materialsen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMaterials science and engineeringen_US
dc.contributor.departmentMetallurgical engineeringen_US
dc.description.advisorStuart R. Stocken_US
dc.identifier.bibid423390en_US


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