Show simple item record

dc.contributor.authorCretegny, Laurenten_US
dc.date.accessioned2008-02-28T12:32:53Z
dc.date.available2008-02-28T12:32:53Z
dc.date.issued2000-08en_US
dc.identifier.urihttp://hdl.handle.net/1853/20141
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshMicroscopesen_US
dc.subject.lcshMetalsen_US
dc.subject.lcshMechanicsen_US
dc.titleUse of atomic force microscopy for characterizing damage evolution during fatigueen_US
dc.typeDissertationen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMaterials science and engineeringen_US
dc.description.advisorAshok Saxenaen_US
dc.identifier.bibid562146en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record