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dc.contributor.authorAllard, Christopher E.en_US
dc.date.accessioned2008-03-27T11:30:11Z
dc.date.available2008-03-27T11:30:11Z
dc.date.issued1996-05en_US
dc.identifier.urihttp://hdl.handle.net/1853/20645
dc.publisherGeorgia Institute of Technologyen_US
dc.rightsAccess restricted to authorized Georgia Tech users only.en_US
dc.subject.lcshResidual stresses Measurementen_US
dc.subject.lcshNon-destructive testingen_US
dc.subject.lcshInterferometry Data processingen_US
dc.titleDevelopment of a non-destructive optical method to measure residual stress in thin rectangular samples employing digital image processingen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMechanical Engineeringen_US
dc.description.advisorSteven Danyluken_US
dc.identifier.bibid426198en_US


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