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    High-speed analog-to-digital conversion in SiGe HBT technology

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    li_xiangtao_200808_phd.pdf (19.11Mb)
    Date
    2008-05-19
    Author
    Li, Xiangtao
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    Abstract
    The objective of this research is to explore high-speed analog-to-digital converters (ADCs) using silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs) for wireless digital receiver applications. The stringent requirements of ADCs for the high-performance next-generation wireless digital receiver include (1) low power, (2) low cost, (3) wide input signal bandwidth, (4) high sampling rate, and (5) medium to high resolution. The proposed research achieves the objective by implementing high-performance ADC's key building blocks and integrating these building blocks into a complete sigma-delta analog-to-digital modulator that satisfies the demanding specifications of next-generation wireless digital receiver applications. The scope of this research is divided into two main parts: (1) high-performance key building blocks of the ADC, and (2) high-speed sigma-delta analog-to-digital modulator. The research on ADC's building blocks includes the design of two high-speed track-and-hold amplifiers (THA) and two wide-bandwidth comparators operating at the sampling rate > 10 GS/sec with satisfying resolution. The research on high-speed sigma-delta analog-to-digital modulator includes the design and experimental characterization of a high-speed second-order low-pass sigma-delta modulator, which can operate with a sampling rate up to 20 GS/sec and with a medium resolution. The research is envisioned to demonstrate that the SiGe HBT technology is an ideal platform for the design of high-speed ADCs.
    URI
    http://hdl.handle.net/1853/24652
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    • Georgia Tech Theses and Dissertations [23403]
    • School of Electrical and Computer Engineering Theses and Dissertations [3303]

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