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    Linear Feature Identification and Inference in Nano-Scale Images

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    05-13.pdf (1.144Mb)
    Date
    2005
    Author
    Lavrik, Ilya A.
    Vidakovic, Brani
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    Abstract
    In this paper a novel method for the analysis of straight line alignment of features in the images based on Hough and Wavelet transforms is proposed. The new method is designed to work specifically with nanoscale images, to detect linear structure formed by the atomic lattice.
    URI
    http://hdl.handle.net/1853/25841
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    • Biomedical Engineering Technical Reports [32]

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