• In-situ Cryogenic Single-Event Effects Testing of High-Speed SiGe BiCMOS Devices 

      Walker, D. Greg; Black, Jeffrey D.; Pellish, Jonathan A.; Alles, Michael L.; Reed, Robert A.; Ramachandran, Vishwanath (Georgia Institute of Technology, 2008-06-25)
      We present details of a first-of-a-kind system that has been custom-designed to enable in-situ single-event (SE) testing at cryogenic temperatures. The system is capable of using either liquid nitrogen (LN2, 77K) or liquid ...