Work function at the tips of multiwalled carbon nanotubes

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Title: Work function at the tips of multiwalled carbon nanotubes
Author: Gao, Rui Ping ; Pan, Zhengwei ; Wang, Z. L. (Zhong Lin)
Abstract: The work function at the tips of individual multiwalled carbon nanotubes has been measured by an in situ transmission electron microscopy technique. The tip work function shows no significant dependence on the diameter of the nanotubes in the range of 14–55 nm. Majority of the nanotubes have a work function of 4.6–4.8 eV at the tips, which is 0.2–0.4 eV lower than that of carbon. A small fraction of the nanotubes have a work function of ~5.6 eV, about 0.6 eV higher than that of carbon. This discrepancy is suggested due to the metallic and semiconductive characteristics of the nanotube.
Description: ©2001 American Institute of Physics. The electronic version of this article is the complete one and can be found online at: Permalink: http://link.aip.org/link/?APPLAB/78/1757/1 DOI:10.1063/1.1356442
Type: Article
URI: http://hdl.handle.net/1853/27084
ISSN: 0003-6951
Citation: Applied Physics Letters, 78 (2001) 1757-1759
Date: 2001-03-19
Contributor: Georgia Institute of Technology. School of Materials Science and Engineering
Publisher: Georgia Institute of Technology
American Institute of Physics
Subject: Carbon nanotubes
Work function
Transmission electron microscopy
Electron field emission

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