In situ imaging of field emission from individual carbon nanotubes and their structural damage

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Date
2002-02-04Author
Wang, Z. L. (Zhong Lin)
Gao, Rui Ping
De Heer, W. A.
Poncharal, P.
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Show full item recordAbstract
Field emission of individual carbon nanotubes was observed by in situ
transmission electron microscopy. A fluctuation in emission current was due to a
variation in distance between the nanotube tip and the counter electrode owing
to a "head-shaking" effect of the nanotube during field emission. Strong
field-induced structural damage of a nanotube occurs in two ways: a
piece-by-piece and segment-by-segment pilling process of the graphitic layers,
and a concentrical layer-by-layer stripping process. The former is believed
owing to a strong electrostatic force, and the latter is likely due to heating
produced by emission current that flowed through the most outer graphitic
layers.