Incoherence effects in reflection electron microscopy
Lanzerotti, Mary Y.
Wang, Z. L. (Zhong Lin)
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The phase contrast imaging of surface steps in reflection electron microscopy is analysed. It is shown that the typical images are seriously affected by incoherence effects and that this arises, not from the strong inelastic scattering which is often present, but from the effective angular spread in the illumination which is frequently determined by the width of the Bragg reflection.