Energy-filtered HREM images of valence-loss electrons
Wang, Z. L. (Zhong Lin)
MetadataShow full item record
A theory is proposed to include the effects of valence excitations in electron image simulations for high-resolution electron microscopy (HREM) based on the single inelastic scattering model. Under the small thickness approximation, this general theory reduces to the simplified theory of perfectly delocalized inelastic scattering model, in which the image can be considered to be an incoherent sum of those incident electrons of different energies weighted by the intensity distribution in the electron energy-loss spectrum from the area where the pattern was taken. The main effect of valence-loss is to introduce a focus shift due to chromatic aberration, resulting in contrast variation (or reversal) of the image. The generalization of this theory for simulations of interface images with considering surface and interface plasmon excitations is given. Calculations for GaAs surface profile images are demonstrated to show the effect of inelastic localization.
Showing items related by title, author, creator and subject.
Electron dynamics in gold and gold–silver alloy nanoparticles: The influence of a nonequilibrium electron distribution and the size dependence of the electron–phonon relaxation Link, S.; Burda, C.; Wang, Z. L. (Zhong Lin); El-Sayed, Mostafa A. (Georgia Institute of TechnologyAmerican Institute of Physics, 1999-07-15)Electron dynamics in gold nanoparticles with an average diameter between 9 and 48 nm have been studied by femtosecond transient absorption spectroscopy. Following the plasmon bleach recovery after low power excitation ...
Probing Defects and Electronic Processes on Gadolinia-doped Ceria Surfaces Using Electron Stimulated Desorption Chen, Haiyan (Georgia Institute of Technology, 2006-01-09)Probing Defects and Electronic Processes on Gadolinia-doped Ceria Surfaces Using Electron Stimulated Desorption Haiyan Chen 133 Pages Directed by Professor Thomas M. Orlando Polycrystalline gadolinia-doped ...
Absolute total apparent ionization, electron stripping, electron capture, and partial ionization cross sections in the energy range 015-100 MeV Puckett, Lawrence Jackson (Georgia Institute of Technology, 1966-12)