A New Approach Towards Property Nanomeasurements Using In Situ TEM
Wang, Z. L. (Zhong Lin)
De Heer, W. A.
Gao, Rui Ping
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Property characterization of nanomaterials is challenged by the small size of the structure because of the difficulties in manipulation. Here we demonstrate a novel approach that allows a direct measurement of the mechanical and electrical properties of individual nanotube-like structures by in-situ transmission electron microscopy (TEM). The technique is powerful in a way that it can directly correlate the atomic-scale microstructure of the carbon nanotube with its physical properties, providing a one-to-one correspondence in structure-property characterization. Applications of the technique will be demonstrated on mechanical properties, the electron field emission and the ballistic quantum conductance in individual nanotubes. A nanobalance technique is demonstrated that can be applied to measure the mass of a single tiny particle as light as 22 fg (1 f= 10-').