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dc.contributor.authorKing, William P.en_US
dc.date.accessioned2009-04-28T17:45:43Z
dc.date.available2009-04-28T17:45:43Z
dc.date.issued2006-11-20en_US
dc.identifier.other9391en_US
dc.identifier.urihttp://hdl.handle.net/1853/27846
dc.descriptionIssued as final reporten_US
dc.description.sponsorshipUnited States. Office of Naval Researchen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.relation.ispartofseriesSchool of Mechanical Engineering ; Project no. E-25-6LVen_US
dc.titleNanoelectronics manufacture, inspection, and repair using thermal dip pen nanolithography
dc.typeTechnical Reporten_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Mechanical Engineeringen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programs
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programs


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