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Georgia Tech Theses and Dissertations
Georgia Tech Theses and Dissertations
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Georgia Tech Theses and Dissertations
Georgia Tech Theses and Dissertations
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Some applications of the Bechhofer-Kiefer-Sobel generalized sequential probability ratio test to software reliability testing
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shieh_jung-sheng_199208_phd_359020.pdf (1.916Mb)
Date
1992-08
Author
Shieh, Jung-Sheng
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URI
http://hdl.handle.net/1853/28928
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Georgia Tech Theses and Dissertations
[23403]
School of Mathematics Theses and Dissertations
[424]
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