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    Depth resolved luminescence from oriented ZnO nanowires

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    09_APL_04.pdf (335.3Kb)
    Date
    2009-12-14
    Author
    Rosenberg, R. A.
    Haija, M. Abu
    Vijayalakshmi, K.
    Zhou, Jun
    Xu, Sheng
    Wang, Z. L. (Zhong Lin)
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    Abstract
    We have utilized the limited penetration depth of x-rays to study the near-surface properties of vertically aligned ZnO nanowires. For an energy of 600 eV the penetration depth varies between 3 and 132 nm as the incidence angle changes from 2° to 33°. Thus, by obtaining optical luminescence spectra as a function of incidence angle, it is possible to probe the near-surface region with nanometer-scale resolution. We will present angle dependent optical luminescence data from oriented ZnO nanowires. By fitting the results to a simple model, we extract a depth for the surface defect regions of ~14 nm.
    URI
    http://hdl.handle.net/1853/31493
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