Show simple item record

dc.contributor.authorStock, S. R. (Stuart)en_US
dc.date.accessioned2010-05-25T14:13:59Z
dc.date.available2010-05-25T14:13:59Z
dc.date.issued1988en_US
dc.identifier.other334267en_US
dc.identifier.urihttp://hdl.handle.net/1853/33269
dc.descriptionIssued as Letter, Reports [nos. 1-6], and Final report, Project no. E-18-648en_US
dc.publisherGeorgia Institute of Technologyen_US
dc.relation.ispartofseriesSchool of Materials Engineering ; Project no. E-18-648en_US
dc.subject.lcshSemiconductors Effect of radiation onen_US
dc.titleCharacterization of advanced electronic and optoelectronic semiconducting materials using synchrontron radiation diffraction imaging for control of crystal growth and fabricationen_US
dc.typeTechnical Reporten_US
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Materials Engineeringen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Office of Sponsored Programs


Files in this item

Thumbnail
Thumbnail

This item appears in the following Collection(s)

Show simple item record