• Login
    View Item 
    •   SMARTech Home
    • College of Sciences (CoS)
    • School of Biology
    • School of Biology Faculty Publications
    • View Item
    •   SMARTech Home
    • College of Sciences (CoS)
    • School of Biology
    • School of Biology Faculty Publications
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    A program for selecting DNA fragments to detect mutations by denaturing gel electrophoresis methods

    Thumbnail
    View/Open
    1994_NAR_001.pdf (960.7Kb)
    Date
    1994-10-11
    Author
    Brossette, Stephen
    Wartell, Roger M.
    Metadata
    Show full item record
    Abstract
    A computer program was developed to automate the selection of DNA fragments for detecting mutations within a long DNA sequence by denaturing gel electrophoresis methods. The program, MELTSCAN, scans through a user specified DNA sequence calculating the melting behavior of overlapping DNA fragments covering the sequence. Melting characteristics of the fragments are analyzed to determine the best fragment for detecting mutations at each base pair position in the sequence. The calculation also determines the optimal fragment for detecting mutations within a user specified mutational hot spot region. The program is built around the statistical mechanical model of the DNA melting transition. The optimal fragment for a given position is selected using the criteria that its melting curve has at least two steps, the base pair position is in the fragment's lowest melting domain, and the melting domain has the smallest number of base pairs among fragments that meet the first two criteria. The program predicted fragments for detecting mutations in the cDNA and genomic DNA of the human p53 gene.
    URI
    http://hdl.handle.net/1853/34537
    Collections
    • School of Biology Faculty Publications [227]

    Browse

    All of SMARTechCommunities & CollectionsDatesAuthorsTitlesSubjectsTypesThis CollectionDatesAuthorsTitlesSubjectsTypes

    My SMARTech

    Login

    Statistics

    View Usage StatisticsView Google Analytics Statistics
    • About
    • Terms of Use
    • Contact Us
    • Emergency Information
    • Legal & Privacy Information
    • Accessibility
    • Accountability
    • Accreditation
    • Employment
    • Login
    Georgia Tech

    © Georgia Institute of Technology

    • About
    • Terms of Use
    • Contact Us
    • Emergency Information
    • Legal & Privacy Information
    • Accessibility
    • Accountability
    • Accreditation
    • Employment
    • Login
    Georgia Tech

    © Georgia Institute of Technology