Optimal allocation of reactive power to mitigate fault delayed voltage recovery
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The Masters Thesis research focuses on reactive power and voltage control during and following major power system disturbances such as faults and subsequent loss of transmission line(s) or generator(s), voltage recovery phenomena following successful fault clearing, dynamic swings of power systems and local voltage suppression, etc. During these events, load and other system dynamics may cause reactive power deficiencies and system voltage issues such as delayed voltage recovery. These phenomena may lead to secondary events such as tripping of loads and/or circuits. Dynamic VAr sources such as generators, static VAr compensators (SVCs), STATCOMs etc and to a lesser degree static VAr sources such as capacitor or reactor banks, can help the system recover from these contingencies by providing fast modulation of the reactive power. Because of the higher cost of dynamic VAr resources, it is important to optimize the deployment of these devices by minimizing the total installed capacity of dynamic VAR resources while meeting the technical requirement and achieving the necessary performance of the system. We refer to this problem as the optimal allocation of dynamic VAR sources (OAODVARS). OAODVARS has been addressed with traditional analytic methods as well as with Artificial Intelligence methods such as genetic algorithms and Tabu search using mostly power flow type models. Both type of methods, as reported in the literature, have not provided satisfactory solutions because they ignore system dynamics and especially load dynamics, in other words they are based on power flow type models. In addition the AI methods have been proved to be extremely inefficient. We propose a new approach that has the following two advantages: (a) it is based on a realistic model that captures system dynamics and (b) it is based on the efficient successive approximation dynamic programming. The solution is provided as a sequence of planning decisions over the planning horizon. The proposed method will be demonstrated on the IEEE 24-bus reliability test system.