Design and optimization of RF test structures for mm-wave circuit design

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1853/42922

Title: Design and optimization of RF test structures for mm-wave circuit design
Author: Mills, Richard P., III
Abstract: This work discusses a methodology developed for robust RF test structure design for SiGe HBTs operating at mm-wave frequencies.
Type: Thesis
URI: http://hdl.handle.net/1853/42922
Date: 2011-11-18
Publisher: Georgia Institute of Technology
Subject: Mm-wave
RF
Test structures
Semiconductors
Metal oxide semiconductors, Complementary
Silicon
Radio frequency integrated circuits
Department: Electrical and Computer Engineering
Advisor: Committee Chair: Cressler, John; Committee Member: Davis, Jeff; Committee Member: Papapolymerou, John
Degree: MS

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