Georgia Tech Manufacturing Institute OSP Research Reports
Office of Sponsored Programs research reports by faculty and researchers.
All materials in SMARTech are protected under U.S. Copyright Law and all rights are reserved. Such materials may be used, quoted or reproduced for educational purposes only with prior permission, provided proper attribution is given. Any redistribution, reproduction or use of the materials, in whole or in part, is prohibited without prior permission of the author.
Recent Submissions
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Analysis of the effects of wafer slicing on the mechanical integrity of silicon wafers
(Georgia Institute of Technology, 2011-12-31) -
DURIP / instrumentation for the testing of friction & wear under very high electromagnetic stress
(Georgia Institute of Technology, 2007-01-31) -
Capturing design process information and rationale to support knowledge-based design and analysis integration
(Georgia Institute of Technology, 2004-08-30) -
Instrumentation for the testing of friction and wear under very high electromagnetic stress
(Georgia Institute of Technology, 2007-02-01) -
Design-analysis associativity technology for PSI : phase 1 report : pilot demonstration of STEP-based stress templates
(Georgia Institute of Technology, 1998) -
Product data-driven analysis in the life cycle support process : tasks 1 and 2
(Georgia Institute of Technology, 1998)
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