Now showing items 1-6 of 6
Two-wave-plate compensator method for full-field retardation measurements
(Georgia Institute of Technology, 2006-01)
The two-wave-plate compensator (TWC) method is expanded for full-field retardation measurements by use of a polarization microscope. The sample image is projected onto a CCD camera connected to a computer, allowing the ...
Prototype CO₂ laser-induced long-period fiber grating variable optical attenuators and optical tunable filters
(Georgia Institute of Technology, 2004-03)
Prototype devices capable of variable attenuation at a fixed wavelength, wavelength tuning at a constant attenuation, and combinations of these spectral characteristics are demonstrated in CO₂ laser-induced long-period ...
Refractive-index profiling of azimuthally asymmetric optical fibers by microinterferometric optical phase tomography
(Georgia Institute of Technology, 2005-05)
Accurate nondestructive refractive-index profiling is needed in the modeling, design, and manufacturing of optical fibers and fiber devices. Most profile measurement techniques cannot correctly characterize fibers with ...
Microinterferometric optical phase tomography for measuring small, asymmetric refractive-index differences in the profiles of optical fibers and fiber devices
(Georgia Institute of Technology, 2005-01)
A new technique, microinterferometric optical phase tomography, is introduced for use in measuring small, asymmetric refractive-index differences in the profiles of optical fibers and fiber devices. The method combines ...
Polarization-dependent loss and birefringence in long-period fiber gratings
(Georgia Institute of Technology, 2003-12)
Widely used descriptions and relationships for birefringence and polarization-dependent loss (PDL), developed primarily for ultraviolet-induced long-period fiber gratings (LPFGs) written in optical fiber, can be invalid ...
Optical-fiber-to-waveguide coupling using carbon-dioxide-laser-induced long-period fiber gratings
(Georgia Institute of Technology, 2005-08)
Optical fibers are expected to play a role in chip-level and board-level optical interconnects because of limitations on the bandwidth and level of integration of electrical interconnects. Therefore, methods are needed to ...