Specific contact resistance at metal/carbon nanotube interfaces

Abstract

In this report, the specific contact resistance between a thin film single wall carbon nanotube electrode and a deposited silver contact was measured. The specific contact resistance was found to be 20 mΩ cm², which is an order of magnitude higher than typically observed in standard Si photovoltaic technology. We demonstrate that when utilized as the transparent anode in organic photovoltaics, the specific contact resistance has the potential to induce non-negligible resistive power losses. Thus, specific contact resistance will adversely affect the performance of these systems and should therefore be addressed. © 2009 American Institute of Physics.