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dc.contributor.authorHutsel, Michael R.en_US
dc.contributor.authorIngle, Reeveen_US
dc.contributor.authorGaylord, Thomas K.en_US
dc.date.accessioned2012-11-14T20:56:56Z
dc.date.available2012-11-14T20:56:56Z
dc.date.issued2009-09
dc.identifier.citationHutsel, Michael R. and Ingle, Reeve and Gaylord, Thomas K., "Accurate cross-sectional stress profiling of optical fibers," Applied Optics, 48, 26, 4985-4995 (September 10 2009)en_US
dc.identifier.issn0003-6935
dc.identifier.urihttp://hdl.handle.net/1853/45348
dc.description© 2009 Optical Society of America. The definitive version of this paper is available at: http://dx.doi.org/10.1364/AO.48.004985en_US
dc.descriptionDOI: 10.1364/AO.48.004985en_US
dc.description.abstractA novel technique for determining two-dimensional, cross-sectional stress distributions in optical fibers and fiber-based devices is presented. Use of the Brace-Kohler compensator technique and a polarization microscope for the measurement of retardationen_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectFiber opticsen_US
dc.subjectOptical communicationsen_US
dc.subjectFiber characterizationen_US
dc.subjectFiber propertiesen_US
dc.subjectMicroscopyen_US
dc.subjectPolarimetryen_US
dc.titleAccurate cross-sectional stress profiling of optical fibersen_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Electrical and Computer Engineeringen_US
dc.publisher.originalOptical Society of Americaen_US
dc.identifier.doi10.1364/AO.48.004985


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