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dc.contributor.authorChang, Yin-Jungen_US
dc.contributor.authorGaylord, Thomas K.en_US
dc.contributor.authorChang, Gee-Kungen_US
dc.date.accessioned2012-11-14T20:56:56Z
dc.date.available2012-11-14T20:56:56Z
dc.date.issued2007-04
dc.identifier.citationChang, Yin-Jung and Gaylord, Thomas K. and Chang, Gee-Kung, "Attenuation in waveguides on FR-4 boards due to periodic substrate undulations," Applied Optics, 46, 12, 2234-2243 (April 20 2007)en_US
dc.identifier.issn0003-6935
dc.identifier.urihttp://hdl.handle.net/1853/45350
dc.description© 2007 Optical Society of America. The definitive version of this paper is available at: http://dx.doi.org/10.1364/AO.46.002234en_US
dc.descriptionDOI: 10.1364/AO.46.002234en_US
dc.description.abstractThe guided-mode attenuation associated with optical-interconnect-polymer waveguides fabricated on FR-4 printed-circuit boards is quantified. The rigorous transmission-line network approach is used and the FR-4 substrate is treated as a long-period substrate grating. A quantitative metric for an appropriate matrix truncation is presented. The peaks of attenuation are shown to occur near the Bragg conditions that characterize the leaky-wave stop bands. For a typical 400 µm period FR-4 substrate with an 8 µm corrugation depth, a buffer layer thickness of about 40 µm is found to be needed to make the attenuation negligibly small.en_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectDiffraction gratingsen_US
dc.subjectIntegrated opticsen_US
dc.subjectGuided wavesen_US
dc.subjectOptical devicesen_US
dc.titleAttenuation in waveguides on FR-4 boards due to periodic substrate undulationsen_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Electrical and Computer Engineeringen_US
dc.publisher.originalOptical Society of Americaen_US
dc.identifier.doi10.1364/AO.46.002234


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