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dc.contributor.authorBachim, Brent L.en_US
dc.contributor.authorGaylord, Thomas K.en_US
dc.date.accessioned2012-11-14T20:56:56Z
dc.date.available2012-11-14T20:56:56Z
dc.date.issued2005-01
dc.identifier.citationBachim, B. L. and Gaylord, Thomas K., "Microinterferometric optical phase tomography for measuring small, asymmetric refractive-index differences in the profiles of optical fibers and fiber devices," Applied Optics, 44, 3, 316-327 (January 20 2005)en_US
dc.identifier.issn0003-6935
dc.identifier.urihttp://hdl.handle.net/1853/45353
dc.description© 2005 Optical Society of America. The definitive version of this paper is available at: http://dx.doi.org/10.1364/AO.44.000316en_US
dc.descriptionDOI: 10.1364/AO.44.000316en_US
dc.description.abstractA new technique, microinterferometric optical phase tomography, is introduced for use in measuring small, asymmetric refractive-index differences in the profiles of optical fibers and fiber devices. The method combines microscopy-based fringe-field interferometry with parallel projection-based computed tomography to characterize fiber index profiles. The theory relating interference measurements to the projection set required for tomographic reconstruction is given, and discrete numerical simulations are presented for three test index profiles that establish the technique's ability to characterize fiber with small, asymmetric index differences. An experimental measurement configuration and specific interferometry and tomography practices employed in the technique are discussed.en_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectFiber opticsen_US
dc.subjectOptical communicationsen_US
dc.subjectFiber characterizationen_US
dc.subjectImaging systemsen_US
dc.subjectTomographyen_US
dc.subjectMicroscopyen_US
dc.subjectInterference microscopyen_US
dc.titleMicrointerferometric optical phase tomography for measuring small, asymmetric refractive-index differences in the profiles of optical fibers and fiber devicesen_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Electrical and Computer Engineeringen_US
dc.publisher.originalOptical Society of Americaen_US
dc.identifier.doi10.1364/AO.44.000316


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