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dc.contributor.authorLin, Chien-Ien_US
dc.contributor.authorGaylord, Thomas K.en_US
dc.date.accessioned2012-12-03T21:03:09Z
dc.date.available2012-12-03T21:03:09Z
dc.date.issued2010-02
dc.identifier.citationLin, Chien-I and Gaylord, Thomas K., "Characterization of the loss of plasmonic modes in planar metal-insulator-metal waveguides by a coupling-simulation approach," Applied Optics, 49, 6, 936-944 (February 20 2010)en_US
dc.identifier.issn0003-6935
dc.identifier.urihttp://hdl.handle.net/1853/45478
dc.description© 2010 Optical Society of Americaen_US
dc.descriptionThe definitive version of this paper is available at: http://dx.doi.org/10.1364/AO.45.002955en_US
dc.descriptionDOI: 10.1364/AO.45.002955en_US
dc.description.abstractMetal–insulator–metal (MIM) structures have been the subject of great interest as nanoscale plasmonic waveguides. The modeling and measurement of the loss in these waveguides is one of the critical issues in realizing the plasmon-based nanocircuitry. Due to the subwavelength size of the structure, the light injection and the measurement of the loss in MIM structures typically require tapered fibers or waveguides, as well as multiple waveguide structures with various length scales [8, 9] or scanning near-field optical microscopy. The transverse transmission/reflection (TTR) method is presented for determining the loss of plasmonic modes in MIM waveguides. The approach is based on determining the width of the reflection angular spectrum in the attenuated total reflection configuration. Owing to its transverse character, the TTR method potentially provides a more straightforward and simpler way to determine the loss of plasmonic modes in MIM structures.en_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectOptical devicesen_US
dc.subjectOptics at surfacesen_US
dc.subjectSurface plasmonsen_US
dc.titleCharacterization of the loss of plasmonic modes in planar metal-insulator-metal waveguides by a coupling-simulation approachen_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Electrical and Computer Engineeringen_US
dc.publisher.originalOptical Society of Americaen_US
dc.identifier.doi10.1364/AO.49.000936


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