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dc.contributor.authorMaikisch, Jonathan S.en_US
dc.contributor.authorGaylord, Thomas K.en_US
dc.date.accessioned2012-12-03T21:03:10Z
dc.date.available2012-12-03T21:03:10Z
dc.date.issued2012-07
dc.identifier.citationMaikisch, Jonathan S. and Gaylord, Thomas K., "Compact silicon diffractive sensor: design, fabrication, and prototype," Applied Optics, 51, 19, 4325-4332 (July 1 2012)en_US
dc.identifier.issn1559-128X
dc.identifier.urihttp://hdl.handle.net/1853/45480
dc.description© 2012 Optical Society of Americaen_US
dc.descriptionThe definitive version of this paper is available at: http://dx.doi.org/10.1364/AO.51.004325en_US
dc.descriptionDOI:10.1364/AO.51.004325en_US
dc.description.abstractAn in-plane constant-efficiency variable-diffraction-angle grating and an in-plane high-angular-selectivity grating are combined to enable a new compact silicon diffractive sensor. This sensor is fabricated in silicon-on-insulator and uses telecommunications wavelengths. A single sensor element has a micron-scale device size and uses intensity-based (as opposed to spectral-based) detection for increased integrability. In-plane diffraction gratings provide an intrinsic splitting mechanism to enable a two-dimensional sensor array. Detection of the relative values of diffracted and transmitted intensities is independent of attenuation and is thus robust. The sensor prototype measures refractive index changes of 10 ⁻⁴ . Simulations indicate that this sensor configuration may be capable of measuring refractive index changes three or four orders of magnitude smaller. The characteristics of this sensor type make it promising for lab-on-a-chip applicationsen_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectDiffraction and gratingsen_US
dc.subjectDiffraction gratingsen_US
dc.subjectIntegrated opticsen_US
dc.subjectSensorsen_US
dc.titleCompact silicon diffractive sensor: design, fabrication, and prototypeen_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Electrical and Computer Engineeringen_US
dc.publisher.originalOptical Society of Americaen_US
dc.identifier.doi10.1364/AO.51.004325


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