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dc.contributor.authorLin, Chien-Ien_US
dc.contributor.authorGaylord, Thomas K.en_US
dc.date.accessioned2012-12-04T20:52:20Z
dc.date.available2012-12-04T20:52:20Z
dc.date.issued2010-11
dc.identifier.citationLin, Chien-I and Gaylord, Thomas K., "Loss measurement of plasmonic modes in planar metal-insulator-metal waveguides by an attenuated total reflection method," Optics Letters, 35, 22, 3814-3816 (November 15 2010)en_US
dc.identifier.issn0146-9592
dc.identifier.urihttp://hdl.handle.net/1853/45494
dc.description© 2010 Optical Society of America.en_US
dc.descriptionThe definitive version of this paper is available at: http://.doi.org/10.1364/OL.35.003814en_US
dc.descriptionDOI: 10.1364/OL.35.003814en_US
dc.description.abstractWe report experimental excitation and characterization of surface plasmon modes in planar metal–insulator–metal (MIM) waveguides. Our approach is based on determining the width of the reflection angular spectrum in the attenuated total reflection (ATR) configuration. Owing to its transverse character, the ATR configuration provides a more straightforward and simpler way to determine the loss of plasmonic modes in MIM structures, compared to using tapered end couplers with multiple waveguide samples or scanning near-field optical microscopy. In this Letter, two waveguide structures with Au claddings and 50/200nm SiO ₂ cores are investigated. The propagation lengths measured at λ=1.55μm are 5.7 and 18μm , respectively, in agreement with the theoretical predictions.en_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectOptical devicesen_US
dc.subjectWaveguidesen_US
dc.subjectOptics at surfacesen_US
dc.subjectSurface plasmonsen_US
dc.subjectOptoelectronicsen_US
dc.subjectPhotonic integrated circuitsen_US
dc.titleLoss measurement of plasmonic modes in planar metal-insulator-metal waveguides by an attenuated total reflection methoden_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Electrical and Computer Engineeringen_US
dc.publisher.originalOptical Society of Americaen_US
dc.identifier.doi10.1364/OL.35.003814


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