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dc.contributor.authorWang, Fengtaoen_US
dc.contributor.authorLiu, Fuhanen_US
dc.contributor.authorChang, Gee-Kungen_US
dc.contributor.authorAdibi, Alien_US
dc.date.accessioned2012-12-11T18:45:00Z
dc.date.available2012-12-11T18:45:00Z
dc.date.issued2008-02
dc.identifier.citationWang, Fengtao and Liu, Fuhan and Chang, Gee-Kung and Adibi, Ali, "Precision measurements for propagation properties of high-definition polymer waveguides by imaging of scattered light," Optical Engineering , 47, 2, 024602-024602-4 (February 2008)en_US
dc.identifier.issn0091-3286
dc.identifier.urihttp://hdl.handle.net/1853/45521
dc.description©2008 SPIE--The International Society for Optical Engineering. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. The electronic version of this article is the complete one and can be found online at: http://dx.doi.org/10.1117/1.2842390en_US
dc.descriptionDOI: 10.1117/1.2842390en_US
dc.description.abstractWe present a reliable, nondestructive, and real-time technique for characterization of propagation properties of planar optical waveguides based on accurately imaging the scattered light from the optical waveguide using a sensitive charge-coupled device (CCD) camera with built-in integration functionality. This technique can be used for real-time investigation of the propagation properties (loss, mode profile, bending properties, etc.) as well as the fabrication quality of planar optical waveguides. With this technique, we evaluate high-definition polymer optical waveguides on printed circuit board (PCB) substrates with a very low loss of 0.065dB/cm at a wavelength of 850nm, and measurement accuracy is less than 0.01dB/cm. We expect this technique with the given CCD camera to be suitable for reliably measuring loss coefficients well below 0.1dB/cm.en_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectIntegrated opticsen_US
dc.subjectPhotopolymersen_US
dc.subjectScatteringen_US
dc.subjectOptical interconnectsen_US
dc.titlePrecision measurements for propagation properties of high-definition polymer waveguides by imaging of scattered lighten_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Packaging Research Centeren_US
dc.publisher.originalSociety of Photo-optical Instrumentation Engineers (SPIE)en_US
dc.identifier.doi10.1117/1.2842390


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