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dc.contributor.authorScrimgeour, Janen_US
dc.contributor.authorCurtis, Jennifer E.en_US
dc.date.accessioned2012-12-14T17:52:33Z
dc.date.available2012-12-14T17:52:33Z
dc.date.issued2012-06
dc.identifier.citationScrimgeour, January and Curtis, Jennifer E., "Aberration correction in wide-field fluorescence microscopy by segmented-pupil image interferometry," Optics Express, 20, 13, 14534-14541 (June 18 2012)en_US
dc.identifier.issn1094-4087
dc.identifier.urihttp://hdl.handle.net/1853/45566
dc.description© 2012 Optical Society of Americaen_US
dc.descriptionThe definitive version of this paper is available at: http://dx.doi.org/10.1364/OE.20.014534en_US
dc.descriptionDOI:10.1364/OE.20.014534en_US
dc.description.abstractWe present a new technique for the correction of optical aberrations in wide-field fluorescence microscopy. Segmented-Pupil Image Interferometry (SPII) uses a liquid crystal spatial light modulator placed in the microscope’s pupil plane to split the wavefront originating from a fluorescent object into an array of individual beams. Distortion of the wavefront arising from either system or sample aberrations results in displacement of the images formed from the individual pupil segments. Analysis of image registration allows for the local tilt in the wavefront at each segment to be corrected with respect to a central reference. A second correction step optimizes the image intensity by adjusting the relative phase of each pupil segment through image interferometry. This ensures that constructive interference between all segments is achieved at the image plane. Improvements in image quality are observed when Segmented-Pupil Image Interferometry is applied to correct aberrations arising from the microscope’s optical path.en_US
dc.language.isoen_USen_US
dc.publisherGeorgia Institute of Technologyen_US
dc.subjectAtmospheric and oceanic opticsen_US
dc.subjectActive or adaptive opticsen_US
dc.subjectHolographyen_US
dc.subjectDiffractive opticsen_US
dc.subjectMedical optics and biotechnologyen_US
dc.subjectImaging systemsen_US
dc.subjectMicroscopyen_US
dc.subjectFluorescence microscopyen_US
dc.subjectFourier opticsen_US
dc.subjectSignal processingen_US
dc.subjectSpatial light modulatorsen_US
dc.subjectMicroscopyen_US
dc.titleAberration correction in wide-field fluorescence microscopy by segmented-pupil image interferometryen_US
dc.typeArticleen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Center for Organic Photonics and Electronicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. School of Physicsen_US
dc.contributor.corporatenameGeorgia Institute of Technology. Institute for Bioengineering and Bioscienceen_US
dc.publisher.originalOptical Society of Americaen_US
dc.identifier.doi10.1364/OE.20.014534


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